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A Study on Software Fault Analysis and Management Method using Defect Tracking System
Young Joon Moon , Sung Yul Rhew The KIPS Transactions:PartD,
Vol. 15, No. 3, pp. 321-326,
Jun.
2008
10.3745/KIPSTD.2008.15.3.321
10.3745/KIPSTD.2008.15.3.321
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All publications of KTCCS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTCCS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
